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Systematic error
Displayed below are the optical parameters used when measuring erythrocyte ghosts. The second column presents estimated systematic errors of the parameters. These variate the resulting cell substrate distance as shown in the last column.

FLIC measurement is insensitive to multilayer reflection. Additionally only the error due to the refractive index of the cleft between the cell and the substrate is proportional to the measured distance itself. The other systematic errors are independent of the measured distance.

Parameter
value
systemat. error
D dcleft
nSi at l =633nm
3.87
0.05
0.00nm
k Si at l =633nm
0.017
0.005
0.04nm
ncleft
1.333
+ 0.05
0.50nm
nmem
1.450
0.05
0.06nm
dmem
4.0nm
0.5nm
0.04nm
ncyt
1.333
+ 0.05
0.02nm
angle of transition dipole
90°
10°
0.03nm
apertureexcitation
47.3°
0.42nm
apertureemission
48.6°
0.29nm
max. of spectrumemission
565nm
5nm
0.01nm

Total systematic error: 0.72nm